JESD 74 Early Life Failure Rate Calculation Procedure for Semiconductor Componen

hlperng

JESD 74A:2007, Early Life Failure Rate Calculation Procedure for Semiconductor Components


早期壽命(early life)階段是這幾年JEDEC制訂半導體元件可靠度標準的重點議題之一，特別以「早期壽命失效率」一詞來定義與說明物品在此一階段的壽命特性，並且出版JESD 74說明如何規劃早期壽命失效試驗及計算早期壽命失效率的程序。早期壽命階段就是過往大家談可靠度時常用的浴缸曲線的早夭期，除JESD47之外，有強調早期失效的是通信預估標準：Telcordia SR-332。


JESD 74的目錄如下：
  1. Scope
  2. Reference Documents
  3. Terms and Definitions
  4. General Requirements
  5. Calculating ELFR
  Annex A: Example Using the Exponential Distribution with One (1) Failure Mechanism and A Single ELF Test
  Annex B: Example Using the Exponential Distribution with Two (2) Failure Mechanisms and A Single ELF Test
  Annex C: Example Using the Exponential Distribution with One (1) Failure Mechanism in Three (3) ELF Tests
  Annex D: Example Using the Exponential Distribution with Two (2) Failure Mechanisms in Three (3) ELF Tests
  Annex E: Example Using a Weibull Distribution with Decreasing Rate with One Failure Mechanism and A Single ELF Test
  Annex F: Example Using the Weibull Distribution with Two (2) Failure Mechanisms and A Single ELF Test
  Annex G: Example Using a Weibull Distribution with Decreasing Rate with One (1) Failure Mechanism and Three (3) ELF Tests
  Annex H: Example Using a Weibull Distribution with Descreasing Rate with Two (2) Failure Mechanisms and Three (3) ELF Tests
  Annex J: Chi Square Values
  Annex K: (informative ) Differences between JESD 74A and JESD 74