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Andrew E. Perkins - Suresh K. Sitaraman
"Solder Joint Reliability Prediction for Multiple Environments"
ISBN 978-0-387-79393-1
P.161
CAE的模擬也是應該把REFLOW條件加入,以便計算銲點疲勞壽命
JESD 47I:2012, Stress-Test-Driven Qualification of Integrated Circuits
濕度敏感度水準前處理(MSL Preconditioning) (PC),JESD22-A113,是 JESD47 第 5.6 節<非密封封裝鑑定試驗要求>(Nonhermetic package qualification test requirements),「表2:非密封封裝元件鑑定試驗」(Qualification tests for components in nonhermetic packages)的第1道應力。
Conditions:
G) PC (Pre-conditioning) ensures that a device will be able to withstand multiple assembly cycles, and to simulate the stress from Printed Circuit Board assembly that a device in a field operation would receive prior to acceleration stress testing.
JESD22-A113F:2008Forward
This document provides an industry standard test method for preconditioning components that is representative of a typical industry multiple solder reflow operation.
Introduction
The typical use of surface mount devices (SMD) involves subjecting the SMDs to elevated temperatures during board assembly, which combined with moisture in the package can induce internal package damage that could be a reliability concern. Preconditioning of SMD packages is used to simulate the effects of board assembly on moisturized packages, prior to reliability testing. This allows reliability testing at the component level on as shippable products with a board assembly simulation. During preconditioning, test samples are subjected to temperature cycling (optional), dry bake, moisture soaking, solder reflow simulation, flux, rinse, dry, and electrical test before reliability testing.
3.6 Temperature Cycle ChamberTemperature Cycle Chamber capabel of operating, as a minimum, over the range of (-40 +0/-10) °C to (+60 °C +10/-0) °C per JESD22-A104. This equipment is only required if optional Step 4.3 is used.
4.3 Temperature cycling Perform five (5) cycles of temperature cycle from -40 °C (or lower) to 60 °C (or higher) to simulate shipping conditions. Acceptable alternative test conditions and temperature tolerances are A through I and L through N as defined in Table 1 of JESD22-A104, Temperature Cycling. This step is operational based on product requirements.
5個TCT為模擬運送, 一般情況下定義-40~60C.
For IC package, such as flip chip or BGA solder joints, and 光器件耦合(optics coupling)
請教設定Typical Cycles/Hr, Ramp rate, Soak time, Soak mode建議是多少?
Thanks